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Author:

Li, Hui (Li, Hui.) | He, Meng (He, Meng.) | Zhang, Ze (Zhang, Ze.)

Indexed by:

EI Scopus SCIE

Abstract:

Quantitative phase analysis is one of the major applications of X-ray powder diffraction. The essential principle of quantitative phase analysis is that the diffraction intensity of a component phase in a mixture is proportional to its abundance. Nevertheless, the diffraction intensities of the component phases cannot be compared with each other directly since the coherent scattering power per unit cell (or chemical formula) of each component phase is usually different. The coherent scattering power per unit cell of a crystal is well represented by the sum of the squared structure factors, which cannot be calculated directly when the crystal structure data is unavailable. Presented here is a way to approximate the coherent scattering power per unit cell based solely on the unit cell parameters and the chemical contents. This approximation is useful when the atomic coordinates for one or more of the phases in a sample are unavailable. An assessment of the accuracy of the approximation is presented. This assessment indicates that the approximation will likely be within 10% when X-ray powder diffraction data is collected over a sufficient portion of the measurable pattern.

Keyword:

Parseval theorem quantitative phase analysis X-ray powder diffraction coherent scattering power

Author Community:

  • [ 1 ] [Li, Hui]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 2 ] [He, Meng]Natl Ctr Nanosci & Technol, CAS Ctr Excellence Nanosci, CAS Key Lab Nanosyst & Hierarch Fabricat, Beijing 100190, Peoples R China
  • [ 3 ] [He, Meng]Univ Chinese Acad Sci, Sch Phys Sci, Beijing 100049, Peoples R China
  • [ 4 ] [He, Meng]Tianmu Lake Inst Adv Energy Storage Technol, Liyang 213300, Jiangsu, Peoples R China
  • [ 5 ] [Zhang, Ze]Zhejiang Univ, Hangzhou 310014, Zhejiang, Peoples R China

Reprint Author's Address:

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Source :

POWDER DIFFRACTION

ISSN: 0885-7156

Year: 2022

Issue: 1

Volume: 37

Page: 34-39

0 . 5

JCR@2022

0 . 5 0 0

JCR@2022

ESI Discipline: PHYSICS;

ESI HC Threshold:41

JCR Journal Grade:4

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 2

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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