Revealing　the　position　of　materials　with　chemical　selectivity　at　atomic　scale　within　functional　nanoparticles　is　essential　to　understand　and　control　their　performance　and　cutting-edge　atom　probe　tomography　is　a　powerful　tool　to　undertake　this　task.　In　this　paper,　we　demonstrate　three　effective　methods　to　prepare　the　needle-shaped　specimens　required　for　atom　probe　tomography　measurements　from　nanoparticles　of　different　sizes　and　provide　examples　of　how　atom　probe　can　be　used　to　provide　data　that　is　critical　to　their　functionality.　Samples　measured　include　lithium-ion　batteries　(LIBs)　cathode　nanoparticles　(300　-　500　nm),　nickel-doped　silicon　dioxide　(Ni@SiO2)　catalytic　nanoparticles　(100　-　200　nm)　and　tin-doped　copper　(Sn@Cu)　catalytic　nanoparticles　(＜100　nm).　The　methods　presented　can　be　used　to　address　the　ongoing　challenge　of　specimen　preparation　from　particle　samples　for　atom　probe　measurement,　and　they　provide　high　quality　data.　These　methods　will　broaden　the　application　of　atom　probe　tomography　and　will　provide　alternative　option　for　researchers　to　assess　the　performance/structure　of　their　functional　nanomaterials.