Gear　involute　artefact　(GIA)　is　a　kind　of　measurement　standard　used　to　calibrate　involute　measuring　instruments.　To　measure　the　profile　deviation　of　GIA　more　accurately,　the　effect　on　the　measurement　of　a　gear　involute　profile　caused　by　the　error　of　the　probe　position　is　considered,　the　value　of　profile　deviations　would　be　affected　and　the　measurement　curve　of　profile　deviations　would　be　compressed　or　stretched　along　the　roll　path　length,　caused　by　the　error　of　the　probe　position.　Moreover,　about　60%　of　the　measurement　errors　are　concentrated　within　the　involute　root　of　roll　path　length　rho=　0-5　mm.　Based　on　the　above　research,　an　adjustment　method　for　the　probe　position　with　a　double　roller-guide　involute　measuring　instrument　is　proposed　and　measurement　experiments　are　carried　out　using　probes　with　probe　radius　r(o)　=　0.5　mm,　1.5　mm　and　2.5　mm.　As　the　error　of　probe　position　e　＞　0,　the　curve　of　profile　deviations　at　the　root　of　the　involute　is　biased　towards　the　body.　As　the　error　of　probe　position　e　＜　0,　the　profile　deviation　curve　at　the　root　of　the　involute　except　for　the　vicinity　of　base　circle　is　biased　towards　the　body,　while　the　profile　deviation　curve　near　the　base　circle　is　biased　out　of　the　body　caused　by　the　interference　of　the　transition　surface,　and　the　measurement　curve　of　profile　deviations　at　the　root　of　the　involute　is　significantly　compressed.　These　errors　decrease　as　the　probe　radius　increases　and　the　error　of　the　probe　position　decreases.　The　difference　of　profile　slope　deviations　and　profile　form　deviations　measured　by　the　three　probes　after　adjustment　is　0.11　mu　m　and　0.04　mu　m　respectively,　which　indicates　the　feasibility　of　the　probe　adjustment　method　described　above.　The　research　supports　the　machining　and　measurement　of　a　high-precision　gear　involute　artefact.