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作者:

Tian, Yanzhong (Tian, Yanzhong.) | An, Tong (An, Tong.) | Qin, Fei (Qin, Fei.) | Gong, Yanpeng (Gong, Yanpeng.) | Dai, Yanwei (Dai, Yanwei.) | Chen, Yanpeng (Chen, Yanpeng.)

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EI Scopus

摘要:

With the development of new energy vehicles, its control component (automotive IGBT module) has met new opportunities and challenges. Automotive IGBT modules are in severe service conditions and often suffer from vibration environment. Therefore, the vibration analysis of automotive IGBT module has important practical significance. In this paper, finite element software is used to study the stress distribution of automotive IGBT module under two vibration modes: simple harmonic vibration and random vibration, and a comparison is made. By observing the stress nephogram of simple harmonic vibration and random vibration, it can be found that the stress in the middle of the module and the root of the bonding wire is larger in both vibration modes. © 2022 IEEE.

关键词:

Finite element method Reliability analysis Stress analysis Vibration analysis Insulated gate bipolar transistors (IGBT)

作者机构:

  • [ 1 ] [Tian, Yanzhong]Beijing University of Technology, Institute of Electronics Packaging Technology and Reliability, Beijing Key Laboratory of Advanced Manufacturing Technology, Faculty of Materials and Manufacturing, Beijing, China
  • [ 2 ] [An, Tong]Beijing University of Technology, Institute of Electronics Packaging Technology and Reliability, Beijing Key Laboratory of Advanced Manufacturing Technology, Faculty of Materials and Manufacturing, Beijing, China
  • [ 3 ] [Qin, Fei]Beijing University of Technology, Institute of Electronics Packaging Technology and Reliability, Beijing Key Laboratory of Advanced Manufacturing Technology, Faculty of Materials and Manufacturing, Beijing, China
  • [ 4 ] [Gong, Yanpeng]Beijing University of Technology, Institute of Electronics Packaging Technology and Reliability, Beijing Key Laboratory of Advanced Manufacturing Technology, Faculty of Materials and Manufacturing, Beijing, China
  • [ 5 ] [Dai, Yanwei]Beijing University of Technology, Institute of Electronics Packaging Technology and Reliability, Beijing Key Laboratory of Advanced Manufacturing Technology, Faculty of Materials and Manufacturing, Beijing, China
  • [ 6 ] [Chen, Yanpeng]Beijing University of Technology, Institute of Electronics Packaging Technology and Reliability, Beijing Key Laboratory of Advanced Manufacturing Technology, Faculty of Materials and Manufacturing, Beijing, China

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年份: 2022

语种: 英文

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SCOPUS被引频次: 7

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