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作者:

Long, Xiang (Long, Xiang.) | Rong, Lu (Rong, Lu.) | Lin, Hao (Lin, Hao.) | Wang, Yunxin (Wang, Yunxin.) | Zhao, Jie (Zhao, Jie.) | Lin, Shufeng (Lin, Shufeng.) | Wang, Dayong (Wang, Dayong.)

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摘要:

Ptychography is a lensless, wide-field, diffraction imaging method that can reconstruct the object transmittance function and the probe distribution simultaneously. Traditionally, lateral mechanical movement is necessary in the time-consuming data acquisition process, resulting in disability to investigate dynamic phenomena. Single-shot ptychography is therefore proposed which divides the incident light into multiple tilted sub-probes through a beam splitting element, e.g., pinhole array and Dammann grating, meanwhile the diffraction patterns are recorded simultaneously in spatial multiplexing mode. In this study, we propose a single-shot ptychography approach using a phase-only spatial light modulator. In order to realize multi-angle modulation, four different grey images are loaded in different quadrants of the modulator, which generates a specific phase delay. Considering the inconsistent wavefront of the probe beams, multi-mode ptychographic algorithm is also adopted which treats probe beams differently. The proposed method is expected to promote single-shot ptychography for piratical applications. © 2022 SPIE.

关键词:

Light modulation Probes Diffraction Incident light Light modulators Data acquisition

作者机构:

  • [ 1 ] [Long, Xiang]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Rong, Lu]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Rong, Lu]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing; 100124, China
  • [ 4 ] [Lin, Hao]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Wang, Yunxin]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Wang, Yunxin]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing; 100124, China
  • [ 7 ] [Zhao, Jie]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing; 100124, China
  • [ 8 ] [Zhao, Jie]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing; 100124, China
  • [ 9 ] [Lin, Shufeng]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing; 100124, China
  • [ 10 ] [Lin, Shufeng]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing; 100124, China
  • [ 11 ] [Wang, Dayong]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing; 100124, China
  • [ 12 ] [Wang, Dayong]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing; 100124, China

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ISSN: 0277-786X

年份: 2022

卷: 12478

语种: 英文

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