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Abstract:
The thermomechanical reliabilities of TSV based structures are closely affected by the protrusion deformation, stress-strain constitutive behavior and microstructure evolution of TSV-Cu under various thermal loadings. In this study, the stress-strain constitutive curves of TSV-Cu under various annealing conditions considering holding time effect are acquired by the nanoindentation test and finite element (FE) reverse analysis. The yielding softening in stress-strain curves is found if the holding time is less than 90 min. However, the stable stress-strain curves are obtained as holding time exceeds 90 min. Furthermore, the mechanisms of softening and stability in stress-strain curves are revealed by observing the microstructure evolution of TSV-Cu with a wide range of holding time. In addition, the relationships among protrusion height, constitutive curves as well as micro-structure parameter of TSV-Cu with different annealing holding time are built. This study provides an intrinsic insight on the correlations of deformation, constitutive curves, and microstructure for TSV-Cu annealing pro-cesses considering holding time effect.
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MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
ISSN: 1369-8001
Year: 2023
Volume: 158
4 . 1 0 0
JCR@2022
ESI Discipline: MATERIALS SCIENCE;
ESI HC Threshold:26
Cited Count:
SCOPUS Cited Count: 3
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 1
Affiliated Colleges: