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Author:

Han, Jun (Han, Jun.) | Zhao, Jia-Hao (Zhao, Jia-Hao.) | Zhao, Jie (Zhao, Jie.) | Xing, Yan-Hui (Xing, Yan-Hui.) | Cao, Xu (Cao, Xu.) | Fu, Kai (Fu, Kai.) | Song, Liang (Song, Liang.) | Deng, Xu-Guang (Deng, Xu-Guang.) | Zhang, Bao-Shun (Zhang, Bao-Shun.)

Indexed by:

EI PKU CSCD

Abstract:

The effects of different kinds of interface treatment on the characteristic of AlGaN/GaN MIS-HEMTs were studied in this paper. N2 and NH3 plasma pretreatment were used to improve the interface quality. The results show that N2 plasma pretreatment could reduce the current collapse of devices. By optimizing the time of N2 plasma pretreatment, it was found that the dynamic characteristic of devices with 10 min the pretreatment was improved, while that of 30 min was degraded. As a gate dielectric intercalation layer, the annealed AlN interlayer can effectively improve the dynamic characteristic of the device. The Vth hysteresis was decreased from 411 mV to 111 mV, and the device current collapse factor was reduced from 42.04 to 4.76 after under OFF-state VD stress of 900. © 2019, Science Press. All right reserved.

Keyword:

III-V semiconductors Gate dielectrics High electron mobility transistors Ammonia Aluminum nitride Aluminum gallium nitride Electric current measurement Gallium nitride

Author Community:

  • [ 1 ] [Han, Jun]Key Laboratory of Opto-electronics Technology, Ministry of Education, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Zhao, Jia-Hao]Key Laboratory of Opto-electronics Technology, Ministry of Education, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Zhao, Jie]Key Laboratory of Opto-electronics Technology, Ministry of Education, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Zhao, Jie]Key Laboratory of Nano Devices and Applications, Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou; 215123, China
  • [ 5 ] [Xing, Yan-Hui]Key Laboratory of Opto-electronics Technology, Ministry of Education, Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Cao, Xu]Key Laboratory of Opto-electronics Technology, Ministry of Education, Beijing University of Technology, Beijing; 100124, China
  • [ 7 ] [Fu, Kai]Key Laboratory of Nano Devices and Applications, Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou; 215123, China
  • [ 8 ] [Song, Liang]Key Laboratory of Nano Devices and Applications, Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou; 215123, China
  • [ 9 ] [Deng, Xu-Guang]Key Laboratory of Nano Devices and Applications, Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou; 215123, China
  • [ 10 ] [Zhang, Bao-Shun]Key Laboratory of Nano Devices and Applications, Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou; 215123, China

Reprint Author's Address:

  • [xing, yan-hui]key laboratory of opto-electronics technology, ministry of education, beijing university of technology, beijing; 100124, china

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Source :

Chinese Journal of Luminescence

ISSN: 1000-7032

Year: 2019

Issue: 7

Volume: 40

Page: 915-921

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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