The　(Ag1-xCux)2ZnSnS4　(ACZTS)　absorption　layers　with　different　Ag　atomic　ratio　were　fabricated　by　using　co-electrodeposition　and　magnetron　sputtering.　The　composition,　structure,　morphology　and　performance　of　the　film　were　investigated　by　X-ray　diffraction　(XRD),　raman　spectra,　scanning　electron　microscope　(SEM),　energy　dispersive　X-ray　spectroscopy　(EDS)　and　electrochemical　measurements.　The　results　show　that　the　ACZTS　film　is　Cu　poor　and　Zn　rich.　The　incorporation　of　Ag　has　a　great　influence　on　the　morphology　of　the　film.　The　growth　of　grain　size　can　be　obviously　improved　with　the　increase　of　the　Ag　atomic　ratio,　and　the　surface　of　film　becomes　denser;　after　the　incorporation　of　Ag,　the　surface　of　the　film　has　n-type　and　p-type　semiconductor　features;　when　the　Ag　atomic　ratio　is　22%,　the　absorption　of　the　incident　light　is　significantly　enhanced,　and　the　transient　current　density　is　the　largest,　when　the　Ag　atomic　ratio　is　28%,　the　enhancement　of　steady　current　density　is　the　most　obvious.　©　2018,　Journal　of　Materials　Engineering.　All　right　reserved.