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作者:

Xia, Zhifang (Xia, Zhifang.) | Gu, Ke (Gu, Ke.) (学者:顾锞) | Wang, Shiqi (Wang, Shiqi.) | Liu, Hantao (Liu, Hantao.) | Kwong, Sam (Kwong, Sam.)

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摘要:

The screen content (SC) pictures, such as webpages, serve as a visible and convenient medium to well-represent the Internet information, and therefore, the visual quality of SC pictures is highly significant and has attained a growing amount of attention. Accurate quality evaluation of SC pictures not only provides the fidelity of the conveyed information, but also contributes to the improvement of the user experience. In practical applications, a reliable estimation of SC pictures plays a considerably critical role for the optimization of the processing systems as the guidance. Based on these motivations, this paper proposes a novel method for precisely assessing the quality of SC pictures using very sparse reference information. Specifically, the proposed quality method separately extracts the macroscopic and microscopic structures, followed by comparing the differences of macroscopic and microscopic features between a pristine SC picture and its corrupted version to infer the overall quality score. By studying the feature histogram for dimensionality reduction, the proposed method merely requires two features as the reference information that can be exactly embedded in the file header with very few bits. Experiments manifest the superiority of our algorithm as compared with state-of-the-art relevant quality metrics when applied to the visual quality evaluation of SC pictures.

关键词:

Anisotropic magnetoresistance Distortion measurement Estimation Feature extraction Macroscopic microscopic structure Microscopy quality estimation screen content (SC) picture sparse reference Visualization

作者机构:

  • [ 1 ] [Xia, Zhifang]Beijing Univ Technol, Fac Informat Technol, Beijing Adv Innovat Ctr Future Internet Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Xia, Zhifang]State Informat Ctr China, Beijing 100045, Peoples R China
  • [ 3 ] [Gu, Ke]Beijing Univ Technol, Fac Informat Technol, Beijing Adv Innovat Ctr Future Internet Technol, Beijing Key Lab Computat Intelligence & Intellige, Beijing 100124, Peoples R China
  • [ 4 ] [Wang, Shiqi]City Univ Hong Kong, Dept Comp Sci, Hong Kong, Peoples R China
  • [ 5 ] [Kwong, Sam]City Univ Hong Kong, Dept Comp Sci, Hong Kong, Peoples R China
  • [ 6 ] [Liu, Hantao]Cardiff Univ, Sch Comp Sci & Informat, Cardiff CF24 3AA, S Glam, Wales

通讯作者信息:

  • 顾锞

    [Gu, Ke]Beijing Univ Technol, Fac Informat Technol, Beijing Adv Innovat Ctr Future Internet Technol, Beijing Key Lab Computat Intelligence & Intellige, Beijing 100124, Peoples R China

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来源 :

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS

ISSN: 0278-0046

年份: 2020

期: 3

卷: 67

页码: 2251-2261

7 . 7 0 0

JCR@2022

ESI学科: ENGINEERING;

ESI高被引阀值:28

JCR分区:1

被引次数:

WoS核心集被引频次: 9

SCOPUS被引频次: 16

ESI高被引论文在榜: 0 展开所有

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