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作者:

Jiao, Jingpin (Jiao, Jingpin.) (学者:焦敬品) | Yang, Sufang (Yang, Sufang.) | He, Cunfu (He, Cunfu.) (学者:何存富) | Wu, Bin (Wu, Bin.)

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摘要:

Aiming at the influence of multi-mode phenomenon on the defect detection performance in Lamb wave detection, in this paper the linear array single-mode Lamb wave selection method is studied. Based on the theoretical analysis of linear array Lamb wave propagation issue in infinite plate, a linear array single-mode Lamb wave selection method based on genetic algorithm is developed. Under the condition of keeping the linear array excitation amplitudes identical, the optimized time delays are applied to the elements of the linear array, therefore a single mode Lamb wave excitation is realized. Moreover, the influence of excitation frequency on linear array Lamb wave mode selection is studied, and the detection frequency for optimal single mode selection is obtained. The simulation and detection experiment results show that single A0 and S0 mode detection can be realized through controlling the excitation time delays of linear array elements. The research work provides a feasible technical means for the mode selection of ultrasonic guided wave. © 2018, Science Press. All right reserved.

关键词:

Genetic algorithms Guided electromagnetic wave propagation Surface waves Time delay Ultrasonic applications Ultrasonic waves

作者机构:

  • [ 1 ] [Jiao, Jingpin]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Yang, Sufang]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [He, Cunfu]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Wu, Bin]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing; 100124, China

通讯作者信息:

  • 焦敬品

    [jiao, jingpin]college of mechanical engineering and application electronics technology, beijing university of technology, beijing; 100124, china

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来源 :

Chinese Journal of Scientific Instrument

ISSN: 0254-3087

年份: 2018

期: 11

卷: 39

页码: 155-162

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次: 1

ESI高被引论文在榜: 0 展开所有

万方被引频次:

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