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作者:

Li, Yong (Li, Yong.) | Yan, Wei-Ming (Yan, Wei-Ming.) (学者:闫维明) | Liu, Jing-Bo (Liu, Jing-Bo.) | Xie, Meng-Fei (Xie, Meng-Fei.)

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摘要:

Compared with far-field earthquake records, near-fault earthquake records contain long-period components and large velocity pulses which can lead to more severe seismic damage of flexible bridges. Continuous viaducts are a common type of bridge and suffer more if they are close to seismic faults. Seismic vulnerability analysis was conducted on a typical four-span continuous viaduct subjected to near-fault and far-field earthquake record inputs. Subsequently, a shaking table test was conducted to obtain dynamic responses of the viaduct under typical near-fault earthquake excitations. The analysis results showed that the vulnerability under near-fault earthquake excitations with velocity pulses was higher than that under far-field or design seismic record inputs. For seismic vulnerable analysis of bridge systems the damage measures of piers and bearings should be taken into consideration synthetically. The shaking table test also showed that the tested dynamic response subject to typical near-fault earthquake records was higher than that subject to far-field or artificial earthquake records. © 2018, Engineering Mechanics Press. All right reserved.

关键词:

Bridges Damage detection Dynamic response Earthquakes Faulting Seismic design

作者机构:

  • [ 1 ] [Li, Yong]School of Civil Engineering, Shijiazhuang Tiedao University, Shijiazhuang; Hebei; 050043, China
  • [ 2 ] [Yan, Wei-Ming]Beijing Laboratory of Earthquake Engineering and Structural Retrofit, Beijing University of Technology, Beijing; 100024, China
  • [ 3 ] [Liu, Jing-Bo]Department of Civil Engineering, Tsinghua University, Beijing; 100084, China
  • [ 4 ] [Xie, Meng-Fei]School of Civil Engineering, Shijiazhuang Tiedao University, Shijiazhuang; Hebei; 050043, China

通讯作者信息:

  • [li, yong]school of civil engineering, shijiazhuang tiedao university, shijiazhuang; hebei; 050043, china

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来源 :

Engineering Mechanics

ISSN: 1000-4750

年份: 2018

期: 4

卷: 35

页码: 52-60 and 86

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次: 5

ESI高被引论文在榜: 0 展开所有

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