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作者:

Yao, Peng (Yao, Peng.) | Li, Xiaoyan (Li, Xiaoyan.) (学者:李晓延)

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EI SCIE

摘要:

Full intermetallics (IMCs) solder joints are of great significance to electronic packaging technology. In this paper, some efforts have been made for bridging research gap on reliabilities of such joints. Shear fracture of different strain rates, for Cu/Cu3Sn/Cu joints derived from Cu-15 mu m Sn-Cu sandwich structure, was comprehensively analyzed. With the strain rates of 6.67 x 10(-2) s(-1), 6.67 x 10(-1) s(-1) , and 6.67 s(-1), the shear strength of Cu/Cu3Sn/Cu joints was, respectively, 44 MPa, 48.4 MPa, and 57.6 MPa, which presented an ascending trend. The increased strength of joints was attributed to the intensification of work-hardening effect within interfacial region. For the strain rates of 6.67 x 10(-2) s(-1) and 6.67 x 10(-1) s(-1), the fracture of joints was both a mixture of transgranular fracture and intergranular fracture within Cu3Sn, while the fractured path both had no diversion and kept continuous. For the strain rate of 6.67 s(-1), only transgranular fracture occurred within Cu3Sn, and the fractured path diverted with the appearance of step. The transgranular fracture at these three strain rates all belonged to cleavage fracture, and their proportion presented the increasing trend of 25.5% -> 59.5% -> 100% (Strain rates: 6.67 x 10(-2) s(-1) -> 6.67 x 10(-1) s(-1) -> 6.67 s(-1)). Because of the fracture mechanism of different strain rates, the crack propagation resistance increased by a larger extent for 6.67 x 10(-1) s(-1) -> 6.67 s(-1) in comparison with that for 6.67 x 10(-2) s(-1) -> 6.67 x 10(-1) s(-1). Moreover, the strain rate sensitivity of Cu/Cu3Sn/Cu joints was smaller than that of conventional joints, which was due to the different interfacial structure of two joints.

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作者机构:

  • [ 1 ] [Yao, Peng]Beijing Univ Technol, Coll Mat Sci & Engn, 100 Ping Yuan, Beijing, Peoples R China
  • [ 2 ] [Li, Xiaoyan]Beijing Univ Technol, Coll Mat Sci & Engn, 100 Ping Yuan, Beijing, Peoples R China

通讯作者信息:

  • 李晓延

    [Yao, Peng]Beijing Univ Technol, Coll Mat Sci & Engn, 100 Ping Yuan, Beijing, Peoples R China;;[Li, Xiaoyan]Beijing Univ Technol, Coll Mat Sci & Engn, 100 Ping Yuan, Beijing, Peoples R China

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来源 :

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS

ISSN: 0957-4522

年份: 2020

期: 4

卷: 31

页码: 2862-2876

2 . 8 0 0

JCR@2022

ESI学科: MATERIALS SCIENCE;

ESI高被引阀值:37

JCR分区:3

被引次数:

WoS核心集被引频次: 7

SCOPUS被引频次: 7

ESI高被引论文在榜: 0 展开所有

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