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Author:

Zhang, H. H. (Zhang, H. H..) | Liu, S. M. (Liu, S. M..) | Han, S. Y. (Han, S. Y..) | Fan, L. F. (Fan, L. F..) (Scholars:范立峰)

Indexed by:

EI Scopus SCIE

Abstract:

The numerical manifold method (NMM) is superior in discontinuous analysis, benefiting from its bi-cover systems, i.e., the mathematical cover and the physical cover. In this work, the NMM is devoted to compute the T-stress for two-dimensional functionally graded materials (FGMs) with multiple cracks. The displacement field for cracked FGMs is firstly solved by the NMM and then the related T-stress is evaluated in the NMM postprocessing via the interaction integral method. Two typical examples are firstly tested to verify the accuracy of the proposed method and the domain-independence of the interaction integral, and then another three cases are examined to reveal the effects of material gradients, crack geometries and boundary conditions on the T-stress.

Keyword:

Numerical manifold method Functionally graded materials Interaction integral Multiple cracks T-stress

Author Community:

  • [ 1 ] [Zhang, H. H.]Nanchang Hangkong Univ, Sch Civil Engn & Architecture, Nanchang 330063, Jiangxi, Peoples R China
  • [ 2 ] [Liu, S. M.]Nanchang Hangkong Univ, Sch Civil Engn & Architecture, Nanchang 330063, Jiangxi, Peoples R China
  • [ 3 ] [Han, S. Y.]Nanchang Hangkong Univ, Sch Civil Engn & Architecture, Nanchang 330063, Jiangxi, Peoples R China
  • [ 4 ] [Fan, L. F.]Beijing Univ Technol, Coll Architecture & Civil Engn, Beijing 100084, Peoples R China

Reprint Author's Address:

  • 范立峰

    [Zhang, H. H.]Nanchang Hangkong Univ, Sch Civil Engn & Architecture, Nanchang 330063, Jiangxi, Peoples R China;;[Fan, L. F.]Beijing Univ Technol, Coll Architecture & Civil Engn, Beijing 100084, Peoples R China

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Source :

THEORETICAL AND APPLIED FRACTURE MECHANICS

ISSN: 0167-8442

Year: 2020

Volume: 105

5 . 3 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:115

Cited Count:

WoS CC Cited Count: 16

SCOPUS Cited Count: 16

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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