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作者:

Jiao, Jingpin (Jiao, Jingpin.) (学者:焦敬品) | Chang, Yu (Chang, Yu.) (学者:常宇) | Li, Guanghai (Li, Guanghai.) | He, Cunfu (He, Cunfu.) (学者:何存富) | Wu, Bin (Wu, Bin.)

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摘要:

Based on the low frequency electromagnetic technology, the non-destructive testing of the internal and external surface of the ferromagnetic structures in the industrial pressure equipment is investigated. By analyzing the magnetic flux leakage signal and the amplitude and phase change of the magnetic flux leakage signal, a method for quantitatively characterizing the internal and external surface cracks of ferromagnetic structures is presented. Based on the low frequency magnetic flux leakage simulation model, the variation of the characteristic parameters of the magnetic flux leakage signal in different depths and different positions is studied. Furthermore, a single channel low frequency magnetic flux leakage sensor is developed and applied to detect the internal and external surface of the ferromagnetic structure with different depths and different positions of the artificial crack. Simulating and experimental results show that the amplitude is more sensitive to the depth of the upper surface crack, and the phase value is more sensitive to the depth of the lower surface crack, which provide technical support for the safe operation of the ferromagnetic structures of the industrial pressure equipment. © 2016, Science Press. All right reserved.

关键词:

Cracks Ferromagnetic materials Ferromagnetism Fiber optic sensors Magnetic leakage Nondestructive examination Surface defects

作者机构:

  • [ 1 ] [Jiao, Jingpin]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Chang, Yu]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Li, Guanghai]Chain Special Equipment Inspection and Research Institute, Beijing; 100013, China
  • [ 4 ] [He, Cunfu]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Wu, Bin]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing; 100124, China

通讯作者信息:

  • 焦敬品

    [jiao, jingpin]college of mechanical engineering and application electronics technology, beijing university of technology, beijing; 100124, china

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来源 :

Chinese Journal of Scientific Instrument

ISSN: 0254-3087

年份: 2016

期: 8

卷: 37

页码: 1808-1817

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