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Author:

Zhou, Xintian (Zhou, Xintian.) | Gong, Hao (Gong, Hao.) | Jia, Yunpeng (Jia, Yunpeng.) | Hu, Dongqing (Hu, Dongqing.) | Wu, Yu (Wu, Yu.) | Xia, Tian (Xia, Tian.) | Pang, Haoyang (Pang, Haoyang.) | Zhao, Yuanfu (Zhao, Yuanfu.)

Indexed by:

EI Scopus SCIE

Abstract:

In this paper, the SiC planar MOSFET with built-in reverse MOS-channel diode (SiC MCD-MOSFET) is investigated utilizing TCAD simulation tools. When the device is working as a freewheeling diode, the operation of the parasitic body diode is suppressed effectively due to the lower threshold voltage of the MCD. Therefore, the bipolar degradation issue can be completely solved. In addition, the SiC MCD-MOSFET is featuring superior dynamic characteristics. The input capacitance (CISS), reverse transfer capacitance (CRSS), gate charge (QG) and gate-to-drain charge (QGD) are reduced by a factor of similar to 2, similar to 7, similar to 2 and similar to 10, respectively, as compared to the conventional SiC MOSFET (SiC C-MOSFET). Combined with the slightly increased on-resistance (RON), tremendously enhanced figures of merit (R-ON x Q(G) and R-ON x Q(GD) are decreased by a factor of 1.8 and 9, respectively) are obtained in the SiC MCD-MOSFET. The outstanding performance and easy-to-implement feature make the SiC MCD-MOSFET more attractive for further power electronic applications.

Keyword:

dynamic performance bipolar degradation SiC planar MOSFETs

Author Community:

  • [ 1 ] [Zhou, Xintian]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Gong, Hao]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Jia, Yunpeng]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Hu, Dongqing]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Wu, Yu]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 6 ] [Xia, Tian]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 7 ] [Pang, Haoyang]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 8 ] [Zhao, Yuanfu]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Jia, Yunpeng]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China

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Source :

IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY

ISSN: 2168-6734

Year: 2020

Volume: 8

Page: 619-625

2 . 3 0 0

JCR@2022

Cited Count:

WoS CC Cited Count: 31

SCOPUS Cited Count: 33

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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