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Author:

Fu, Fuji (Fu, Fuji.) | Yang, Jinfu (Yang, Jinfu.) (Scholars:杨金福) | Zhang, Jiahui (Zhang, Jiahui.) | Ma, Jiaqi (Ma, Jiaqi.)

Indexed by:

EI Scopus SCIE

Abstract:

Loop closure detection (LCD) is a challenging task to judge whether the current position of an intelligent robot returns to the previously visited position. Mainstream appearance-based approaches apply robust image representation techniques to describe the scene. However, most of these methods are designed for single images, and the sequence representation method incorporating temporal sequence information is still in the preliminary exploration. In this paper, we propose a compact sequence representation method for hierarchical LCD, ensuring conspicuous performance for the LCD task. Deriving from a group of global features of image sequences, we propose a multi-scale asymmetric temporal convolution network (MATC-Net), which generates sequential features and transformed global features through its aggregation branch and transformation branch, respectively. Based on these two types of features, a MATC-Net-based hierarchical LCD framework including two similarity measurement processes is constructed, through which the best place match is identified. The experimental results show that our method outperforms other counterparts on three datasets, exhibiting the promising potential of leveraging sequential features to LCD task.

Keyword:

Multi-scale asymmetric temporal convolution Loop closure detection network Sequence representation Similarity measurement

Author Community:

  • [ 1 ] [Fu, Fuji]Beijing Univ Technol, Fac Informat Technol, Beijing, Peoples R China
  • [ 2 ] [Yang, Jinfu]Beijing Univ Technol, Fac Informat Technol, Beijing, Peoples R China
  • [ 3 ] [Zhang, Jiahui]Beijing Univ Technol, Fac Informat Technol, Beijing, Peoples R China
  • [ 4 ] [Ma, Jiaqi]Beijing Univ Technol, Fac Informat Technol, Beijing, Peoples R China
  • [ 5 ] [Yang, Jinfu]Beijing Key Lab Computat Intelligence & Intelligen, Beijing, Peoples R China

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Source :

ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE

ISSN: 0952-1976

Year: 2023

Volume: 125

8 . 0 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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