• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Li, Hui (Li, Hui.) | He, Meng (He, Meng.)

Indexed by:

EI Scopus SCIE

Abstract:

The reference intensity ratio (RIR) is the intensity ratio of a specified peak of the target crystalline phase to a certain peak of the reference phase in the powder X-ray diffraction pattern of a mixture of the target and reference phases in a weight ratio of 1:1. The RIR represents the diffraction power of the target phase compared with that of the reference phase. A quantitative phase analysis (QPA) can be readily made on the basis of only a powder pattern when the RIR values of all component phases in the mixture are available. The RIR of a target phase can be measured experimentally or calculated in accordance with its crystal structure. RIR values are given in most powder diffraction files (PDFs) published by the International Centre for Diffraction Data, but there are still more than 110 000 PDFs for which the RIR is absent. Newly discovered phases may be present in a mixture as components of unknown weight fractions, for which the RIR values can be neither measured nor calculated with the currently available method. Herein is presented a new method of calculating the RIR of a crystalline phase from its lattice parameters, the chemical content of the unit cell and a list of normalized intensities of reflections over a sufficiently large diffraction angle range. The new method can be used to calculate not only the absent RIRs in the PDFs but also the RIR of a component phase of a mixture of unknown weight fraction when the lattice parameters and chemical content of the unit cell of the corresponding phase are known.

Keyword:

X-ray powder diffraction quantitative phase analysis reference intensity ratio

Author Community:

  • [ 1 ] [Li, Hui]Beijing Univ Technol, Fac Mat & Mfg, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 2 ] [He, Meng]CAS Ctr Excellence Nanosci, Natl Ctr Nanosci & Technol, CAS Key Lab Nanosyst & Hierarch Fabricat, Beijing 100190, Peoples R China
  • [ 3 ] [He, Meng]Univ Chinese Acad Sci, Beijing 100049, Peoples R China

Reprint Author's Address:

Show more details

Related Keywords:

Source :

JOURNAL OF APPLIED CRYSTALLOGRAPHY

ISSN: 1600-5767

Year: 2023

Volume: 56

Page: 1707-1713

6 . 1 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

Affiliated Colleges:

Online/Total:572/5514930
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.