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作者:

Dai, Yanwei (Dai, Yanwei.) (学者:代岩伟) | Zhao, Libo (Zhao, Libo.) | Zan, Zhi (Zan, Zhi.) | Qin, Fei (Qin, Fei.)

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EI Scopus SCIE

摘要:

When it comes to electronics packaging, measuring the fracture toughness of adhesive materials is critical. Our research involved conducting double cantilever beam (DCB) tests to study the behavior of sintered silver in mode I fracture, which is doped with different weights of nickel-coated multiwall carbon nanotube additives. The results showed that when the sintered silver DCB adhesive joints contained 0.5 wt% nanofiller, their mode I fracture toughness increased to 0.0701 N/mm. This represents an 89.97 % improvement over the fracture toughness of sintered silver without nanofiller additives. The nickel-coated multiwall carbon nanotube nanofillers influenced both the microstructure characteristics and the propagation path of cracks in sintered silver. We used an inverse method to present cohesive zone models of sintered silver with varying nanofiller contents. The representative mode I resistance curves of sintered silver with different contents of nanofiller are also presented and discussed. The results of our study can help increase the reliability and strengthen the mode I fracture resistance for the sintered silver interconnection bonding layer by adding an appropriate nanofiller.

关键词:

Nickel coated multiwall carbon nanotubes Double cantilever beam test Mode I fracture toughness Sintered silver

作者机构:

  • [ 1 ] [Dai, Yanwei]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Dept Mech, Beijing 100124, Peoples R China
  • [ 2 ] [Zhao, Libo]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Dept Mech, Beijing 100124, Peoples R China
  • [ 3 ] [Zan, Zhi]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Dept Mech, Beijing 100124, Peoples R China
  • [ 4 ] [Qin, Fei]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Dept Mech, Beijing 100124, Peoples R China
  • [ 5 ] [Dai, Yanwei]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 6 ] [Qin, Fei]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China

通讯作者信息:

  • 代岩伟

    [Dai, Yanwei]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Dept Mech, Beijing 100124, Peoples R China

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来源 :

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

ISSN: 1369-8001

年份: 2024

卷: 174

4 . 1 0 0

JCR@2022

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SCOPUS被引频次: 2

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