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作者:

Ding, Yang (Ding, Yang.) | Li, Yan (Li, Yan.) | Xu, Ruoyu (Xu, Ruoyu.) | Han, Xiao (Han, Xiao.) | Huang, Kai (Huang, Kai.) | Ke, Xiaoxing (Ke, Xiaoxing.) | Wang, Bo (Wang, Bo.) | Sui, Manling (Sui, Manling.) | Yan, Pengfei (Yan, Pengfei.) (学者:闫鹏飞)

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EI Scopus SCIE

摘要:

Ni-rich LiNixCoyMn1-x-yO2 (NCM) layered oxides are low-cost high-energy density cathode materials, but plagued by its poor thermal stability incurred safety concerns. The thermal failure process of the layered cathode is accompanied by heat generation and oxygen release, which drives the battery into thermal runaway (TR). Aiming to fully understand the TR process and the structure evolution, this work applies diverse characterization techniques onto a polycrystalline Ni-rich layered cathode (LiNi0.83Mn0.05Co0.12O2 (PCN83)) to comprehensively investigate its thermal failure process at multiple scales. From macro level, we validate that it is the cathode thermal failure that drives the battery from the heat accumulation stage into TR in adiabatic conditions. From micro level, transmission electron microscopy (TEM) verifies that the thermal failure of PCN83 starts from 150 degrees C, which is much lower than the TR temperature measured from macro level tests. We reveal that the PCN83 cathode experiences sequential phase transitions before the TR, where the phase transition mechanism is illustrated from the atomic scale and the pore evolution process is unraveled. In situ heating TEM further reveals that thermal failure is preferentially initiated from grain boundaries and defect regions. These findings provide an in-depth understanding of the whole thermal failure process of NMC-based layered cathode materials and sheds new lights on the rational design of Ni-rich cathode materials with improved thermal safety.

关键词:

Ni-rich layered cathode Lithium-ion battery Electron microscopy Phase transition Thermal runaway

作者机构:

  • [ 1 ] [Ding, Yang]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 2 ] [Li, Yan]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 3 ] [Han, Xiao]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 4 ] [Huang, Kai]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 5 ] [Ke, Xiaoxing]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 6 ] [Sui, Manling]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 7 ] [Yan, Pengfei]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 8 ] [Xu, Ruoyu]Huawei Technol Co LTD, Cent Res Inst, Watt Lab, Shenzhen 518129, Peoples R China
  • [ 9 ] [Wang, Bo]Huawei Technol Co LTD, Cent Res Inst, Watt Lab, Shenzhen 518129, Peoples R China

通讯作者信息:

  • [Sui, Manling]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China;;[Yan, Pengfei]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China;;[Xu, Ruoyu]Huawei Technol Co LTD, Cent Res Inst, Watt Lab, Shenzhen 518129, Peoples R China;;[Wang, Bo]Huawei Technol Co LTD, Cent Res Inst, Watt Lab, Shenzhen 518129, Peoples R China;;

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来源 :

NANO ENERGY

ISSN: 2211-2855

年份: 2024

卷: 126

1 7 . 6 0 0

JCR@2022

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