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作者:

Li, Qiuyang (Li, Qiuyang.) | Li, Jingzhen (Li, Jingzhen.) | Chen, Haonan (Chen, Haonan.) | Zhang, Yongzhe (Zhang, Yongzhe.)

收录:

EI Scopus

摘要:

In this paper, the electronic properties and optical absorption characteristics of Indium arsenide (InAs) nanowires with different defects, including antisite defects, vacancy defects, and interstitial defects, at various locations such as the core layer, subsurface, and surface, were investigated using first-principles calculations. The results indicate that InAs nanowires with defects create new impurity energy levels in the energy band structure, with InAs, Asi, and VIn acting as acceptors and AsIn, Ini, and VAs acting as donors, rendering the InAs nanowires p-type or n-type. Furthermore, defects disrupt the absorption properties of the nanowires at the peak of the absorption spectrum in the ultraviolet region, whereas defects positively affect the light absorption of InAs nanowires in the visible and infrared light regions. In particular, it is in the infrared light region that the redshift of the VIn defect model is most pronounced and enhances the infrared absorption of InAs nanowires. © 2024 SPIE.

关键词:

Light absorption Absorption spectroscopy Point defects Nanowires Band structure III-V semiconductors Electronic properties Indium arsenide

作者机构:

  • [ 1 ] [Li, Qiuyang]College of Microelectronics, Key Laboratory of Optoelectronics Technology, Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Li, Jingzhen]College of Microelectronics, Key Laboratory of Optoelectronics Technology, Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Chen, Haonan]College of Microelectronics, Key Laboratory of Optoelectronics Technology, Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Zhang, Yongzhe]College of Microelectronics, Key Laboratory of Optoelectronics Technology, Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China

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ISSN: 0277-786X

年份: 2024

卷: 13182

语种: 英文

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