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Author:

Niu, Nana (Niu, Nana.) | Zhao, Yongsheng (Zhao, Yongsheng.) | Zhang, Caixia (Zhang, Caixia.)

Indexed by:

EI Scopus

Abstract:

During the service of bolts, their preload exhibits a random decreasing trend due to external loads, affecting contact stiffness and connection reliability. System uncertainties can also lead to preload variations within the same group of bolts. In this paper, we use the Wiener process to model this preload decrease, incorporating drift and wave coefficients to capture temporal variability and system uncertainty. This approach accounts for monotonic preload reduction and random fluctuations, enabling accurate calculations. By integrating the time-varying preload uncertainty into the bolted structure's contact stiffness model, we establish a limit state function for structural failure and assess the reliability of the bolted connection over time. © Published under licence by IOP Publishing Ltd.

Keyword:

Bolted joints

Author Community:

  • [ 1 ] [Niu, Nana]Machinery Industry Key Laboratory of Heavy Machine Tool Digital Design and Testing Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Niu, Nana]Institute of Advanced Manufacturing and Intelligent Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Zhao, Yongsheng]Machinery Industry Key Laboratory of Heavy Machine Tool Digital Design and Testing Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Zhao, Yongsheng]Institute of Advanced Manufacturing and Intelligent Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Zhang, Caixia]Machinery Industry Key Laboratory of Heavy Machine Tool Digital Design and Testing Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Zhang, Caixia]Institute of Advanced Manufacturing and Intelligent Technology, Beijing University of Technology, Beijing; 100124, China

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ISSN: 1742-6588

Year: 2024

Issue: 1

Volume: 2819

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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