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Author:

Kang, Rong (Kang, Rong.) | Dai, Yanwei (Dai, Yanwei.) (Scholars:代岩伟) | Qin, Fei (Qin, Fei.) | Li, Yanning (Li, Yanning.)

Indexed by:

CPCI-S EI

Abstract:

In this paper, the thickness effect of sintered silver layer was investigated based on end-notched flexure (ENF) test, and the sensitivity of shear fracture behavior of sintered silver joints with different thickness under the same strain rate was investigated. Four kinds of sintered silver joint ENF samples with four kinds of sintered silver layer thickness were prepared on two pieces of bare copper with 50 mu m, 100 mu m, 150 mu m and 200 mu m thick steel screen printing silver paste. The loading rate is 0.2 mm/min, and the three-point bending test is carried out on the Instron 5948 micro tester. The fracture morphology and microstructure of the sintered silver layer after ENF test are analyzed by Hitachi S4000 scanning electron microscope (SEM) and optical microscope (OM). The compliance based beam method (CBBM) is used to fracture analysis of the specimen. Under certain quasi-static loading conditions, the shear fracture toughness of sintered silver increases with the increase of the thickness of sintered silver layer, and the porosity of sintered silver gradually decreased to a stable value.

Keyword:

nano-silver paste porosity ENF test mode II fracture toughness

Author Community:

  • [ 1 ] [Kang, Rong]Beijing Univ Technol, Fac Mat & Mfg, Inst Elect Packaging Technol & Reliabil, Beijing, Peoples R China
  • [ 2 ] [Dai, Yanwei]Beijing Univ Technol, Fac Mat & Mfg, Inst Elect Packaging Technol & Reliabil, Beijing, Peoples R China
  • [ 3 ] [Qin, Fei]Beijing Univ Technol, Fac Mat & Mfg, Inst Elect Packaging Technol & Reliabil, Beijing, Peoples R China
  • [ 4 ] [Li, Yanning]Beijing Univ Technol, Fac Mat & Mfg, Inst Elect Packaging Technol & Reliabil, Beijing, Peoples R China

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Source :

2023 24TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT

ISSN: 2836-9734

Year: 2023

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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