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作者:

Jiao, Jingpin (Jiao, Jingpin.) (学者:焦敬品) | Ma, Ting (Ma, Ting.) | Liu, Deyu (Liu, Deyu.) | Wu, Bin (Wu, Bin.) | He, Cunfu (He, Cunfu.) (学者:何存富)

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摘要:

Ultrasonic imaging technique can provide more intuitive and reliable detection results for detection personnel, and is widely used in ultrasonic nondestructive testing. However, the ultrasonic detection signal has wide time width and the time-resolution is low. When two defects are adjacent in distance, the echoes from the two defects are overlapped; it is difficult to identify the adjacent defects in ultrasonic imaging. In order to increase the time resolution of ultrasonic detection signal and achieve adjacent defect identification, a pulse compression technique was developed and applied in ultrasonic array imaging, which combines Wiener filtering and autoregressive spectral analysis techniques, and the identification of adjacent defects can be achieved. The influence of the autoregressive order and the attenuation window width on defect identification result in autoregressive spectral analysis was studied; and the optimum parameters were obtained. Simulation and detection experiment results show that the proposed technique can greatly improve the time resolution of the ultrasonic detection signal and achieve adjacent defect identification.

关键词:

Defects Imaging systems Nondestructive examination Personnel testing Signal detection Spectrum analysis Ultrasonic imaging Ultrasonic testing Ultrasonic transducers

作者机构:

  • [ 1 ] [Jiao, Jingpin]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Ma, Ting]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Liu, Deyu]China Special Equipment Inspection and Research Institute, Beijing 100013, China
  • [ 4 ] [Wu, Bin]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [He, Cunfu]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing 100124, China

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来源 :

Chinese Journal of Scientific Instrument

ISSN: 0254-3087

年份: 2014

期: 7

卷: 35

页码: 1614-1621

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