• 综合
  • 标题
  • 关键词
  • 摘要
  • 学者
  • 期刊-刊名
  • 期刊-ISSN
  • 会议名称
搜索

作者:

Jiao, Jingpin (Jiao, Jingpin.) (学者:焦敬品) | Ma, Ting (Ma, Ting.) | Liu, Deyu (Liu, Deyu.) | Wu, Bin (Wu, Bin.) | He, Cunfu (He, Cunfu.) (学者:何存富)

收录:

EI Scopus PKU CSCD

摘要:

Ultrasonic imaging technique can provide more intuitive and reliable detection results for detection personnel, and is widely used in ultrasonic nondestructive testing. However, the ultrasonic detection signal has wide time width and the time-resolution is low. When two defects are adjacent in distance, the echoes from the two defects are overlapped; it is difficult to identify the adjacent defects in ultrasonic imaging. In order to increase the time resolution of ultrasonic detection signal and achieve adjacent defect identification, a pulse compression technique was developed and applied in ultrasonic array imaging, which combines Wiener filtering and autoregressive spectral analysis techniques, and the identification of adjacent defects can be achieved. The influence of the autoregressive order and the attenuation window width on defect identification result in autoregressive spectral analysis was studied; and the optimum parameters were obtained. Simulation and detection experiment results show that the proposed technique can greatly improve the time resolution of the ultrasonic detection signal and achieve adjacent defect identification.

关键词:

Defects Imaging systems Nondestructive examination Personnel testing Signal detection Spectrum analysis Ultrasonic imaging Ultrasonic testing Ultrasonic transducers

作者机构:

  • [ 1 ] [Jiao, Jingpin]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Ma, Ting]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Liu, Deyu]China Special Equipment Inspection and Research Institute, Beijing 100013, China
  • [ 4 ] [Wu, Bin]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [He, Cunfu]College of Mechanical Engineering and Application Electronics Technology, Beijing University of Technology, Beijing 100124, China

通讯作者信息:

电子邮件地址:

查看成果更多字段

相关关键词:

来源 :

Chinese Journal of Scientific Instrument

ISSN: 0254-3087

年份: 2014

期: 7

卷: 35

页码: 1614-1621

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次:

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

近30日浏览量: 2

在线人数/总访问数:575/2894421
地址:北京工业大学图书馆(北京市朝阳区平乐园100号 邮编:100124) 联系我们:010-67392185
版权所有:北京工业大学图书馆 站点建设与维护:北京爱琴海乐之技术有限公司