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作者:

Liu, Zenghua (Liu, Zenghua.) (学者:刘增华) | Chen, Long (Chen, Long.) | Zhu, Yanping (Zhu, Yanping.) | Liu, Xiaoyu (Liu, Xiaoyu.) | He, Cunfu (He, Cunfu.)

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摘要:

The identification and visualization of submillimeter microdefects have long been a critical focus within the realm of ultrasonic testing. The utilization of high-frequency signals is imperative due to the small acoustic interaction structure. An additional benefit of using lasers is their non-contact nature and ability to utilize multiple imaging modes, effectively reducing false or missed detections and enhancing credibility. This study proposes an advanced optimization algorithm for imaging and quantitative evaluation of submillimeter microdefects using laser ultrasonic full matrix capture (FMC) and total focusing method (TFM). The analysis of acoustic directionality under laser excitation and detection provides a foundation for mode selection. In preprocessing, the multi-scale principal component analysis (MSPCA) method is introduced to suppress coherent noise and blind spots. Moreover, phase coherence methods are implemented to further reduce mode artifacts, background noise, and residual surface acoustic wave (SAW). Additionally, multi-mode imaging and mode fusion are achieved using reflected longitudinal waves, reflected shear waves, converted longitudinal waves, and converted shear waves. Experiments were carried out on two different types of microdefects, namely side drilled holes (SDHs) and blind holes (BHs), resulting in high resolution TFM imaging with a minimum BH size of 0.3 mm. The outcomes demonstrate the efficacy of MSPCA in suppressing coherent noise, with further enhancement in imaging quality after phase coherence weighting. In addition, the -6 dB threshold of multi-mode images also provided the size information. This research is poised to contribute to the resolution of quality assessment challenges in powder metallurgy, welding, and additive manufacturing processes.

关键词:

Laser ultrasonic Microdefect Multi-mode imaging Full matrix capture Multi-scale principal component analysis

作者机构:

  • [ 1 ] [Liu, Zenghua]Beijing Univ Technol, Sch Informat Sci & Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Zhu, Yanping]Beijing Univ Technol, Sch Informat Sci & Technol, Beijing 100124, Peoples R China
  • [ 3 ] [He, Cunfu]Beijing Univ Technol, Sch Informat Sci & Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Chen, Long]Beijing Univ Technol, Coll Mech & Energy Engn, Beijing 100124, Peoples R China
  • [ 5 ] [Liu, Xiaoyu]Beijing Univ Technol, Coll Mech & Energy Engn, Beijing 100124, Peoples R China

通讯作者信息:

  • [Liu, Zenghua]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China;;

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来源 :

OPTICS AND LASER TECHNOLOGY

ISSN: 0030-3992

年份: 2024

卷: 181

5 . 0 0 0

JCR@2022

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SCOPUS被引频次: 2

ESI高被引论文在榜: 0 展开所有

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