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作者:

Zhao, Chongning (Zhao, Chongning.) | Hu, Dongqing (Hu, Dongqing.) | Zheng, Yuechao (Zheng, Yuechao.) | Jia, Yunpeng (Jia, Yunpeng.) | Zhou, Xintian (Zhou, Xintian.) | Wu, Yu (Wu, Yu.) | Tang, Yun (Tang, Yun.)

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EI Scopus

摘要:

Providing an additional hole extraction path can significantly enhance the resistance to single-event radiation of SOI-LIGBT devices. This paper designs a 550 V Double RESURF SOI-LIGBT device and studies its single-event effects through simulation. The results indicate that the designed NCSP-LIGBT structure significantly improves resistance to single-event radiation without excessively sacrificing conduction performance. © Published under licence by IOP Publishing Ltd.

关键词:

Radiation effects Insulated gate bipolar transistors (IGBT) Incident solar radiation

作者机构:

  • [ 1 ] [Zhao, Chongning]Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Hu, Dongqing]Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Zheng, Yuechao]Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Jia, Yunpeng]Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Zhou, Xintian]Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Wu, Yu]Beijing University of Technology, Beijing; 100124, China
  • [ 7 ] [Tang, Yun]Beijing University of Technology, Beijing; 100124, China

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来源 :

ISSN: 1742-6588

年份: 2024

期: 1

卷: 2849

语种: 英文

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