Rapid reliability evaluation method of LED based on pseudo-failure lifetime - 文章详情页

作者：

Guo, Wei-Ling (Guo, Wei-Ling.) | Fan, Xing (Fan, Xing.) | Cui, De-Sheng (Cui, De-Sheng.) | Wu, Guo-Qing (Wu, Guo-Qing.) | Yu, Xin (Yu, Xin.)

收录：

EI Scopus PKU CSCD

摘要：

An　efficient　and　rapid　reliability　evaluation　method　of　LED　has　been　proposed.　The　pseudo-failure　lifetime　is　tested　and　the　lifetime　data　is　analyzed　by　Minitab.　The　results　show　that　the　pseudo-failure　lifetime　of　all　samples　are　Weibull　distribution.　The　reliability　evaluation　of　LED　products　are　made　by　comparing　the　scale　parameters　of　Weibull　distribution.　This　method　has　a　certain　reference　value　to　reliability　evaluation　and　life　prediction　of　LED.

关键词：

Light emitting diodes Reliability Weibull distribution

作者机构：

[ 1 ] [Guo, Wei-Ling]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
[ 2 ] [Fan, Xing]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
[ 3 ] [Cui, De-Sheng]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
[ 4 ] [Wu, Guo-Qing]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
[ 5 ] [Yu, Xin]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China

通讯作者信息：

电子邮件地址：

guoweiling@bjut.edu.cn

查看成果更多字段

成果类型
所属机构

所有年份指定年份从至