A low noise multi-channel readout IC for X-ray cargo inspection - 文章详情页

作者：

Wang, Xu (Wang, Xu.) | Yang, Hongyan (Yang, Hongyan.) | Yuan, Ying (Yuan, Ying.) | Wu, Wuchen (Wu, Wuchen.) (学者：吴武臣)

收录：

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摘要：

A　low　noise　multi-channel　readout　integrated　circuit　(IC)　which　converts　a　detector　current　to　analog　voltage　for　X-ray　cargo　inspection　is　described.　The　readout　IC　provides　32　channels　of　a　circuit　having　a　maximum　dynamic　range　of　15　bit　and　is　comprised　of　integrator　gain　selection,　timing　generator,　shift　register　chain,　integrator　array,　sample/hold　(S/H)　stage　amplifier　etc.　It　was　fabricated　using　0.6　μm　standard　CMOS　process,　and　occupies　a　die　area　of　2.7　×　13.9　mm2.　It　operates　at　1　MHz,　consumes　100　mW　from　a　5　V　supply　and　4.096　V　as　reference,　and　has　a　measured　output　noise　of　85　μ　Vrms　on　63　pF　of　integrator　gain　capacitance　and　440　pF　of　photodiode　terminal　capacitance　so　that　steel　plate　penetration　thickness　can　reach　more　than　400　mm.　©　2013　Chinese　Institute　of　Electronics.

关键词：

CMOS integrated circuits Shift registers X rays Capacitance Inspection

作者机构：

[ 1 ] [Wang, Xu]VLSI and System Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
[ 2 ] [Yang, Hongyan]VLSI and System Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
[ 3 ] [Yuan, Ying]VLSI and System Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
[ 4 ] [Wu, Wuchen]VLSI and System Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China

通讯作者信息：

电子邮件地址：

wang_xu@emails.bjut.edu.cn

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