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作者:

Qu, Jingjing (Qu, Jingjing.) | Zhang, Linrui (Zhang, Linrui.) | Wang, Hao (Wang, Hao.) | Song, Xuemei (Song, Xuemei.) | Zhang, Yongzhe (Zhang, Yongzhe.) (学者:张永哲) | Yan, Hui (Yan, Hui.) (学者:严辉)

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EI Scopus SCIE

摘要:

In a CIGS thin film solar cell, the buffer layer is interposed between the absorber layer and the window layer, which plays an important role in interface electricity. CdS is often used as a buffer layer in CIGS cells. Beside the toxicity of Cd, the main drawback of CdS is its relatively narrow band gap (2.4 eV), which can lead to the current loss due to parasitic absorption. In order to reduce the use of CdS, we try other buffer layers instead of CdS and optimize buffer layer structure. Numerical simulation has been used to explore the effect of different buffer layer materials (CdS and ZnSe) on the performance of CuInGaSe2 solar cells with SCAPS-1D software. The main photovoltaic parameters of the analog device: open circuit voltage, short circuit current density, fill factor and conversion efficiency (eta) were compared and analyzed. The results show that different buffer materials and thickness have great influence on the performance of the cell. In this simulation, CdS buffer layer was replaced by ZnSe material, which has a wider band gap. However, the efficiency of this kind of cell is lower than that of CIGS device with CdS buffer layer because of the bad energy band alignment. In order to improve the short-wave absorption and the efficiency of CIGS cell, we simulated a novel CdS/ZnSe double buffer layer structure. The efficiency of the optimized cell with double buffer layer increases from 18.47% (conventional cell with the same CdS buffer layer thickness) to 19.01%.

关键词:

Buffer layer CIGS SCAPS

作者机构:

  • [ 1 ] [Qu, Jingjing]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Zhang, Linrui]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Wang, Hao]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Song, Xuemei]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 5 ] [Zhang, Yongzhe]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 6 ] [Yan, Hui]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China

通讯作者信息:

  • 严辉

    [Yan, Hui]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China

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来源 :

OPTICAL AND QUANTUM ELECTRONICS

ISSN: 0306-8919

年份: 2019

期: 12

卷: 51

3 . 0 0 0

JCR@2022

ESI学科: ENGINEERING;

ESI高被引阀值:52

JCR分区:3

被引次数:

WoS核心集被引频次: 25

SCOPUS被引频次: 21

ESI高被引论文在榜: 0 展开所有

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中文被引频次:

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