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作者:

Zheng, Yang (Zheng, Yang.) | He, Cunfu (He, Cunfu.) (学者:何存富) | Wu, Bin (Wu, Bin.)

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摘要:

Traditional ultrasonic guided wave exciting signal is window-function-modulated sinusoidal signal. Its obvious advantage is narrow frequency bandwidth, which can greatly restrain dispersion. However, this kind of signal needs to change its center frequency in frequency sweeping test, as well as multi-frequency and multi-mode test. Besides, in order to achieve high SNR (signal-to-noise ratio), the acquisition process of each test usually requires hundreds of times averaging, which is time and energy consuming. A new method is proposed, which uses linear-chirp and Gaussian-chirp signals as the exciting signal of ultrasonic guided wave. Linear-chirp signal has a wide frequency bandwidth, and its processed inspection signal is equal to the received signal using traditional window-function-modulated sinusoidal signal; and its center frequency could be any value within the bandwidth of linear-chirp signal, thus it is very suitable for frequency sweeping test, as well as multi-frequency and multi-mode test. Gaussian-chirp signal has the same amplitude-frequency characteristic as that Gaussian windowed sine wave has, however it can achieve the same SNR just with one test as that traditional exciting signal achieves that needs hundreds of times averaging acquisition processes. Therefore this method is time and energy saving. Experiment was carried out, in which two piezoelectric wafers placed on the surfaces of aluminum plates were used to generate Lamb waves. Experiment results verify the effectiveness of the proposed method that uses these two kinds of chirp signals to excite ultrasonic guided wave and carry out subsequent signal processing.

关键词:

Bandwidth Energy conservation Gaussian distribution Guided electromagnetic wave propagation Nondestructive examination Signal processing Signal to noise ratio Surface waves Ultrasonic testing Ultrasonic waves

作者机构:

  • [ 1 ] [Zheng, Yang]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Zheng, Yang]China Special Equipment Inspection and Research Institute, Beijing 100013, China
  • [ 3 ] [He, Cunfu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Wu, Bin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China

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来源 :

Chinese Journal of Scientific Instrument

ISSN: 0254-3087

年份: 2013

期: 3

卷: 34

页码: 552-558

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