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作者:

Chen, Ji-Min (Chen, Ji-Min.) (学者:陈继民) | He, Chao (He, Chao.) | Zhou, Wei-Ping (Zhou, Wei-Ping.) | Shen, Xue-Fei (Shen, Xue-Fei.)

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摘要:

With the aim to lower the surface roughnesses of etched samples and the etching threshold fluence of a direct laser irradiation source and to raise the yield of micro-optical elements, a laser induced backside dry etching technique with the assistance of a solid medium as the absorbed layer was proposed to fabricate transparent dielectric materials by direct laser irradiation. By using an alumina ceramic wafer (Al2O3 in 95%, surface roughness less than 500 nm) as the absorber, a 2D transmittance grating in a micro size binary Diffractive Optical Element (DOE) was fabricated on the fused silica with a thickness of 3.2 mm by the 1064 nm Ytterbium Doped Fiber (YDF) laser. And then, the etching parameter curves were fitted and the effect of laser energy density on the parameters was discussed. Finally, the diffraction patterns of micro structure were observed to examine the features of binary DOE. According to the measured results, the binary transmittance grating shows its grating constant in 25 μm, the depth of trench in 4.2 μm, and the RMS roughness of the trench bottom below 40 nm. Furthermore, the etching threshold influence is estimated below 7.66 J/cm2. These results are much lower than those of the etching without any absorbers.

关键词:

Alumina Aluminum oxide Density (optical) Dielectric materials Diffraction gratings Diffractive optical elements Dry etching Fiber lasers Fused silica Irradiation Optical fiber fabrication Surface roughness

作者机构:

  • [ 1 ] [Chen, Ji-Min]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [He, Chao]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Zhou, Wei-Ping]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Shen, Xue-Fei]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China

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来源 :

Optics and Precision Engineering

ISSN: 1004-924X

年份: 2012

期: 1

卷: 20

页码: 31-37

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次: 2

ESI高被引论文在榜: 0 展开所有

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