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Author:

Liu, Zenghua (Liu, Zenghua.) (Scholars:刘增华) | Wang, Na (Wang, Na.) | He, Cunfu (He, Cunfu.) (Scholars:何存富) | Wu, Bin (Wu, Bin.)

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Abstract:

Based on electromechanical impedance method, the effect of load level and defect degree on impedance spectra obtained by the PZT elements bonded in steel beams is investigated. Different load levels are simulated by applying mass on the steel beam firstly and the influence of the load level on real impedance spectra in the frequency range of 30-40 kHz is analyzed. Defect assessment abilities by using three different statistical methods are compared. It is shown that Root Mean Squared Deviation and Mean Absolute Percentage Deviation can characterize load level in the steel beam very well. Based on this research, circular hole defects are manufactured in steps to simulate different defect degrees. Real impedance spectra in the frequency ranges of 450-650 kHz and 770-920 kHz under different defect degrees are obtained. According to corresponding defect indices obtained by using Root Mean Squared Deviation, it can be found they will increase along with defect degrees. The research results show that electromechanical impedance method has a certain application potential for health monitoring and quantitative defect evaluation of beam-like structures.

Keyword:

Structural health monitoring Solid solutions Loading Defects Steel beams and girders

Author Community:

  • [ 1 ] [Liu, Zenghua]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Wang, Na]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [He, Cunfu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Wu, Bin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China

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Source :

Chinese Journal of Scientific Instrument

ISSN: 0254-3087

Year: 2012

Issue: 8 SUPPL.

Volume: 33

Page: 21-24

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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