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作者:

He, Cunfu (He, Cunfu.) (学者:何存富) | Zhou, Jinjie (Zhou, Jinjie.) | Wu, Bin (Wu, Bin.) | Zheng, Yang (Zheng, Yang.) | Fu, Hao (Fu, Hao.)

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摘要:

A temporal-spatial focusing inspection system for ultrasonic guided wave in pipeline based on time reversal focusing theory is presented in this paper. The system can be used to excite piezoelectric transducer arrays and focus the energy of guided waves at flaw. The key design techniques of this system are: an excitation circuit, which is based on the improved direct digital synthesis (DDS) for synthesizing and emitting time reversal signal, and a small size wide band pulse amplifier with high power output and linear features. With this system, the signal echoed from the crack can be enhanced based on time reversal temporal-spatial focusing effect. Under particular test conditions, experimental work using a transducer array with eight channels was carried out in a pipeline with an artificial flaw. The result shows that the amplitude of the echo signal from the flaw increases by 246% compared with that of the normal test signal. In addition, the signals obtained from the temporal-spatial focusing process have a higher signal to noise ratio, and the dispersion and multimode that occur in normal test signal are restrained.

关键词:

Broadband amplifiers Design Direct digital control systems Focusing Guided electromagnetic wave propagation Inspection Inspection equipment Pipelines Pulse amplifiers Signal to noise ratio Transducers Ultrasonic applications Ultrasonic waves

作者机构:

  • [ 1 ] [He, Cunfu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Zhou, Jinjie]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Wu, Bin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Zheng, Yang]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Fu, Hao]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China

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来源 :

Chinese Journal of Scientific Instrument

ISSN: 0254-3087

年份: 2012

期: 2

卷: 33

页码: 342-348

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