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作者:

Ding, Yan (Ding, Yan.) | Guo, Weiling (Guo, Weiling.) | Zhu, Yanxu (Zhu, Yanxu.) | Liu, Jianpeng (Liu, Jianpeng.) | Yan, Weiwei (Yan, Weiwei.)

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摘要:

8 mil × 10 mil InGaN/GaN blue LEDs with indium tin oxide (ITO) emitting at 460 nm were fabricated. A vacuum evaporation technique was adopted to deposit ITO on P-GaN with thickness of 240 nm. The electrical and optical properties of ITO films on P-GaN wafers, as well as rapid thermal annealing (RTA) effects at different temperatures (100 to 550 °C) were analyzed and compared. It was found that resistivity of 450 °C RTA was as low as 1.19 × 10-4 Ω·cm, along with a high transparency of 94.17% at 460 nm. AES analysis indicated the variation of oxygen content after 450 °C annealing, and ITO contact resistance showed a minimized value of 3.9 × 10-3 Ω·cm2. With 20 mA current injection, it was found that forward voltage and output power were 3.14 V and 12.57 mW. Furthermore, maximum luminous flux of 0.49 lm of ITO RTA at 550 °C was measured, which is the consequence of a higher transparency. © 2012 Chinese Institute of Electronics.

关键词:

Electric properties Gallium nitride Light emitting diodes Rapid thermal annealing Tin Tin oxides Transparency Vacuum evaporation

作者机构:

  • [ 1 ] [Ding, Yan]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Guo, Weiling]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Zhu, Yanxu]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Liu, Jianpeng]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Yan, Weiwei]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China

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来源 :

Journal of Semiconductors

ISSN: 1674-4926

年份: 2012

期: 6

卷: 33

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次: 5

ESI高被引论文在榜: 0 展开所有

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中文被引频次:

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