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Author:

Wang, Su (Wang, Su.) | Lu, De-Chun (Lu, De-Chun.) (Scholars:路德春) | Du, Xiu-Li (Du, Xiu-Li.) (Scholars:杜修力)

Indexed by:

EI Scopus PKU CSCD

Abstract:

Underground structure seismic damage process simulation is an effective means to study the underground structure aseismic performance. Through setting artificial boundary condition, taking dead weight stress of rock and soil mass as an initial state of dynamic response simulation, the static-dynamic coupling numerical simulation of earthquake response of the underground structures is realized. Based on finite element analysis software ABAQUS, taking ultimate shear strain as a failure criterion, the seismic damage process of underground structures is simulated by the birth-death element method. Considering structure depth, the influence of initial geostress on aseismic performance of underground structure is analyzed. The results show that the aseismic performance of underground structures has a most unfavorable depth, namely the most easily damaged depth in earthquake. When the depth exceeds the most easily damaged depth, the ultimate aseismic capacity of structures enhances. If the earthquake damage occurs, the damage degree of structures will be greater with the increasing of depth.

Keyword:

Shear strain ABAQUS Underground structures Earthquakes

Author Community:

  • [ 1 ] [Wang, Su]Key Laboratory of Urban Security and Disaster Engineering, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Lu, De-Chun]Key Laboratory of Urban Security and Disaster Engineering, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Du, Xiu-Li]Key Laboratory of Urban Security and Disaster Engineering, Ministry of Education, Beijing University of Technology, Beijing 100124, China

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Source :

Rock and Soil Mechanics

ISSN: 1000-7598

Year: 2012

Issue: 11

Volume: 33

Page: 3483-3488

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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