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作者:

Xing, Yan-Hui (Xing, Yan-Hui.) | Han, Jun (Han, Jun.) | Deng, Jun (Deng, Jun.) | Li, Jian-Jun (Li, Jian-Jun.) | Xu, Chen (Xu, Chen.) (学者:徐晨) | Shen, Guang-Di (Shen, Guang-Di.)

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摘要:

InGaN: Mg films were grown by metal-organic chemical vapor deposition (MOCVD), and the properties of InGaN: Mg the materials with different source fluxes were studied. The optical and electrical properties show that when epitaxial growth temperature is at 760°C, the TMIn molar flux is certain, the In molecomposition increases with the increase of CP2Mg and III family source molar ratio([CP2Mg]/[III]), and the hole concentration also increases linearly. When [CP2Mg]/[III] is 1.12×10-3, the high hole concentration of 4. 78×1019 cm-3 is obtained. Moreover, the electro-luminescence intensity of the light-emitting diodes (LEDs) with InGaN: Mg as contact layer is enhanced by 28% compared with conventional LEDs.

关键词:

Atomic force microscopy Diodes Electric properties Epitaxial growth Films Fluxes Gallium compounds Hole concentration Industrial chemicals Light Luminescence Metallorganic chemical vapor deposition Organic chemicals Organic light emitting diodes (OLED) Vapor deposition

作者机构:

  • [ 1 ] [Xing, Yan-Hui]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Han, Jun]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Deng, Jun]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Li, Jian-Jun]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Xu, Chen]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Shen, Guang-Di]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

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来源 :

Journal of Optoelectronics Laser

ISSN: 1005-0086

年份: 2011

期: 5

卷: 22

页码: 666-668,672

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WoS核心集被引频次: 0

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