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作者:

Cui, Desheng (Cui, Desheng.) | Guo, Weiling (Guo, Weiling.) | Cui, Bifeng (Cui, Bifeng.) | Ding, Tianping (Ding, Tianping.) | Yin, Fei (Yin, Fei.) | Yan, Weiwei (Yan, Weiwei.)

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EI Scopus PKU CSCD

摘要:

High-power blue light-emitting diodes were biased by negative Human-Body-Mode electrostatic discharge(ESD) with -200, -400, -600, -800, -1100 and -1500 V. The electrical and optical parameters of the LED were measured before and after ESD stressing. The failure mechanisms resulted in by ESD stress were analysised after each ESD stress. The LED had evident soft breakdown due to the generation of defect in active region and cladding layers after ESD stressing at -200, -400, -600 and -800 V. However, when the device was biased to -1100 V and -1500 V, high leakage current of the LED appears and 50% degradation of light output than before stressing. The reason is the generation of melting thread in active region that made LED cannot emit light. In addition, a simple and effective protection circuit for ESD is proposed.

关键词:

Degradation Diodes Electrostatic devices Electrostatics Failure (mechanical) Gallium nitride III-V semiconductors Light emitting diodes Optical devices

作者机构:

  • [ 1 ] [Cui, Desheng]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Guo, Weiling]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Cui, Bifeng]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Ding, Tianping]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Yin, Fei]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Yan, Weiwei]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China

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来源 :

Acta Optica Sinica

ISSN: 0253-2239

年份: 2011

期: 3

卷: 31

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次: 5

ESI高被引论文在榜: 0 展开所有

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