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作者:

Liu, Tie-Gen (Liu, Tie-Gen.) | Li, Xiu-Yan (Li, Xiu-Yan.) | Wang, Yun-Xin (Wang, Yun-Xin.) (学者:王云新) | Deng, Shi-Chao (Deng, Shi-Chao.)

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摘要:

Aiming at the inherent limitations of unimodal biometric systems, a multi-biometric system based on hand vein and iris was proposed. The local scale invariant feature transform (SIFT) features of hand vein were extracted and matched, and the matching ratio of features between the registered image and test image was calculated as the similarity measurement. The feature code of iris was extracted from the detail images obtained using Haar wavelet transform and the weighted Hamming distances was employed to calculate the similarities between the patterns in the database and the pattern to be identified. Finally, the scores from both matching modules were sent to support vector machines (SVM), which realized the fusion at the matching score level and the fusion recognition result was obtained. The performance of the proposed method was tested using the TJU hand vein image database and the CASIA iris database. The equal error rate (EER) of the fusion system is 0.02%. Experimental results demonstrate that the proposed fusion method has excellent recognition performance, which provides new scientific approach to further research on biometrics.

关键词:

Biometrics Database systems Hamming distance Image processing Information fusion Support vector machines Wavelet transforms

作者机构:

  • [ 1 ] [Liu, Tie-Gen]School of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China
  • [ 2 ] [Liu, Tie-Gen]Key Laboratory of Opto-Electronics Information and Technical Science of Ministry of Education, Tianjin University, Tianjin 300072, China
  • [ 3 ] [Li, Xiu-Yan]School of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China
  • [ 4 ] [Li, Xiu-Yan]Key Laboratory of Opto-Electronics Information and Technical Science of Ministry of Education, Tianjin University, Tianjin 300072, China
  • [ 5 ] [Wang, Yun-Xin]College of Applied Sciences, Beijing University of Technology, Beijing 100024, China
  • [ 6 ] [Deng, Shi-Chao]School of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China
  • [ 7 ] [Deng, Shi-Chao]Key Laboratory of Opto-Electronics Information and Technical Science of Ministry of Education, Tianjin University, Tianjin 300072, China

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来源 :

Nanotechnology and Precision Engineering

ISSN: 1672-6030

年份: 2011

期: 1

卷: 9

页码: 44-47

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WoS核心集被引频次: 0

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