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In order to fabricate biaxial textured La2Zr2O7(LZO) buffer layers of high quality for coated conductors, the results of LZO buffers on cube textured Ni-5at%W (Ni5W) substrates were obtained by chemical solution deposition (CSD) using the acetylacetone lanthanum and the acetylacetone zirconium as precursor salts, and the propionic acid as a solvent. After the rapid one-step heat treatment processes, LZO seed layer and two layers of LZO films were prepared on the cubic textured Ni5W substrate via CSD method. It was found that the deposited LZO film with seed layer derived from 0.06 mol/L concentration of solution has a sharp cubic biaxial texture. The values of full width at half maximum (FWHM) of (222) Phi scan and (400) rocking curve of the as-obtained LZO thick film are 6.37° and 5.82°, respectively. The SEM images reveal that the surface of the LZO buffer layer is smooth, homogenous and free-crack. Besides, the thickness of the buffer layers is about 120 nm. All the results show that this LZO film can be used as a buffer layer for the further deposition of YBCO film on it.
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