收录:
摘要:
The growth behavior of tin whiskers on the surface of the oxidized RE-Sn phase was investigated in order to fully understand the nature of whisker growth phenomenon and establish its growth mechanism. The results indicate that large amounts of tin whiskers are formed on the oxidized RE-phases during the storage, some of which change the growth direction continuously, in particular, the diameter of some tin whiskers can be also changed during the turning growth. The change of stress state around tin whisker root results in the growth direction change and the incoordination between the growth rate and the tin atoms supply results in the cross section change.
关键词:
通讯作者信息:
电子邮件地址:
来源 :
Material Science and Technology
ISSN: 1005-0299
年份: 2010
期: 3
卷: 18
页码: 378-381