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作者:

Shi, Yaowu (Shi, Yaowu.) | Liu, Jianping (Liu, Jianping.) | Xia, Zhidong (Xia, Zhidong.) | Lei, Yongping (Lei, Yongping.) (学者:雷永平) | Guo, Fu (Guo, Fu.) (学者:郭福) | Li, Xiaoyan (Li, Xiaoyan.)

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摘要:

In the present work, the creep strain of solder joints is measured using a stepped load creep test on a single specimen. Based on the experimental results, the constitutive model on the steady-state creep strain is established by applying a linear curve fitting for the nano-sized Ag particle-reinforced Sn37Pb based composite solder joint and the Sn37Pb solder joint, respectively. It is indicated that the activation energy of the Ag particle-reinforced Sn37Pb based composite solder joints is higher than that of Sn37Pb solder joints. It is expected that the creep resistance of the Ag particle-reinforced Sn37Pb based composite solder joints is superior to that of Sn37Pb solder. © 2009 Springer Science+Business Media, LLC.

关键词:

Activation energy Binary alloys Creep Creep resistance Creep testing Curve fitting Lead alloys Particle reinforced composites Reinforcement Silver Tin alloys

作者机构:

  • [ 1 ] [Shi, Yaowu]School of Materials Science and Engineering, Beijing University of Technology, 100 Ping Le Yuan, Chaoyang District, Beijing 100022, China
  • [ 2 ] [Liu, Jianping]School of Materials Science and Engineering, Beijing University of Technology, 100 Ping Le Yuan, Chaoyang District, Beijing 100022, China
  • [ 3 ] [Xia, Zhidong]School of Materials Science and Engineering, Beijing University of Technology, 100 Ping Le Yuan, Chaoyang District, Beijing 100022, China
  • [ 4 ] [Lei, Yongping]School of Materials Science and Engineering, Beijing University of Technology, 100 Ping Le Yuan, Chaoyang District, Beijing 100022, China
  • [ 5 ] [Guo, Fu]School of Materials Science and Engineering, Beijing University of Technology, 100 Ping Le Yuan, Chaoyang District, Beijing 100022, China
  • [ 6 ] [Li, Xiaoyan]School of Materials Science and Engineering, Beijing University of Technology, 100 Ping Le Yuan, Chaoyang District, Beijing 100022, China

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来源 :

Journal of Materials Science: Materials in Electronics

ISSN: 0957-4522

年份: 2010

期: 3

卷: 21

页码: 256-261

2 . 8 0 0

JCR@2022

ESI学科: MATERIALS SCIENCE;

JCR分区:3

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SCOPUS被引频次: 8

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