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摘要:
An approach for estimating the non-line changing of the leakage power and the speed of the dual threshold domino OR gates with increasing fan-in based on Wavelet Neural Networks is proposed. Sine all of the average estimating errors are less than 5%, the estimating system has high precision. The reasons for the estimating errors are the changing ratio of the different power in the total power and the effect of capacitor match. At last, through Monte Carlo analysis, the availability of the estimating system under process variation is tested and concludes: With process variation, the estimating system is applicable to leakage power estimation with low fin-in and delay estimation with high fin-in.
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来源 :
Acta Electronica Sinica
ISSN: 0372-2112
年份: 2010
期: 11
卷: 38
页码: 2611-2615
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