To　compensate　the　nonlinear　errors　of　heterodyne　interferometers　in　nanometer　measurement,　an　experimental　investigation　is　conducted.　Based　on　the　polarization　properties　of　a　coated　corner-cube　retro-reflector,　a　model　is　derived　for　describing　the　effect　of　the　axial　rotation　of　a　measuring　cube-corner　retro-reflector　in　the　motion　direction　on　the　first-harmonic　nonlinearity　when　a　laser　emits　the　elliptical　polarized　light.　The　simulation　results　indicate　that　the　first-harmonic　nonlinearity　can　be　reduced　by　the　axial　rotation　of　the　cube-corner　retro　reflector.　The　experimental　result　shows　that　the　first　harmonic　nonlinearity　is　reduced　from　3.48　to　1.39　nm　when　the　axial　orientation　rotation　angle　of　the　measuring　cube-corner　retro　reflector　increases　from　0°　to　100°,　which　is　40%　that　of　the　original　one.　The　method　simplies　the　complexes　of　light　path　and　circuit　systems　for　nonlinear　error　compensation　approaches.