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作者:

Ji, Yuan (Ji, Yuan.) | Wei, Bin (Wei, Bin.) | Wang, Li (Wang, Li.) | Zhang, Yin-Qi (Zhang, Yin-Qi.) | Xie, Xue-Song (Xie, Xue-Song.) | Lü, Chang-Zhi (Lü, Chang-Zhi.) | Zhang, Yue-Fei (Zhang, Yue-Fei.) (学者:张跃飞)

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摘要:

To study the electrical properties of single nanowire and device based on nanowire, a two-probe configuration setup was built for measuring current-voltage (I-V) curves of individual ZnO nanowire with a micromanipulator system in a scanning electron microscope. The I-V curves of ZnO nanowires, i.e., almost linear, typical rectifying, almost symmetric and asymmetric were obtained. I-V characteristics are explained by a metal-semiconductor-metal (M-S-M) model and the thermionic emission theory. The current of ZnO nanowires mainly depends on the degree of coupling between the nanowire and two contact tungsten electrodes. The calculation results of electrical properties for ZnO nanowires shows that the resistance of almost linear curve is 4.2 Ω·cm; the effective Schottky barrier height of rectifying I-V characteristics is 0.47 eV.

关键词:

Electrodes II-VI semiconductors Micromanipulators Nanowires Ohmic contacts Oxide minerals Scanning electron microscopy Schottky barrier diodes Thermionic emission Tungsten Wide band gap semiconductors Zinc oxide

作者机构:

  • [ 1 ] [Ji, Yuan]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Wei, Bin]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Wang, Li]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Zhang, Yin-Qi]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Xie, Xue-Song]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Lü, Chang-Zhi]Electronics Reliability Lab., Beijing University of Technology, Beijing 100124, China
  • [ 7 ] [Zhang, Yue-Fei]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China

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来源 :

Journal of Beijing University of Technology

ISSN: 0254-0037

年份: 2009

期: 9

卷: 35

页码: 1235-1240

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