Electric current stress reliability test of high-power white LED - 文章详情页

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In　order　to　conduct　the　reliability　test　of　LEDs,　experiments,　which　the　electric　current　was　token　as　the　stress,　were　carried　on　3　groups　of　1　W　and　3　W　white-light　LEDs　respectively.　The　experiment　results　show　that　the　main　factors　which　influence　the　reliability　of　the　high-power　LEDs,　are　temperature　of　junction　and　phosphor　powder　invalidation.　In　the　process　of　slow　invalidation,　the　luminous　flux　rate　declined　between　15%　and　20%,　and　the　phenomenon　of　＇the　catalysis　enhance＇　occurred　at　the　beginning　of　the　process.　To　reduce　resistance　from　the　p-n　junction　to　the　environment　and　to　improve　the　material　growth　technology　can　more　effectively　reduce　the　risk　of　non-radiation　and　improve　luminous　efficiency.

关键词：

Catalysis Light emitting diodes Reliability Semiconductor junctions

作者机构：

[ 1 ] [Chen, Jian-Xin]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
[ 2 ] [He, Wei-Li]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
[ 3 ] [Guo, Wei-Ling]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
[ 4 ] [Gao, Wei]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
[ 5 ] [Shi, Chen]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
[ 6 ] [Chen, Xi]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
[ 7 ] [Zhou, Dan]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
[ 8 ] [Zheng, Xin]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

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