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作者:

Xie, Shushan (Xie, Shushan.) | Hu, Dongqing (Hu, Dongqing.) | Kang, Baowei (Kang, Baowei.)

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摘要:

Local lifetime control is obtained by means of local platinum doping using platinum gettering through the vacancy defects induced by proton irradiation. Assisted by total lifetime control using 4 MeV electron irradiation, a fast soft recovery power diode is manufactured. The experiment results show that this kind of diode have fast reverse recovery time, large reverse softness and low reverse leakage. The performance of such diode is on top of congener products.

关键词:

Electron irradiation Platinum Proton irradiation Recovery Semiconductor diodes

作者机构:

  • [ 1 ] [Xie, Shushan]College of Electronic and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Hu, Dongqing]College of Electronic and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Kang, Baowei]College of Electronic and Control Engineering, Beijing University of Technology, Beijing 100022, China

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来源 :

Research and Progress of Solid State Electronics

ISSN: 1000-3819

年份: 2008

期: 1

卷: 28

页码: 20-23,32

被引次数:

WoS核心集被引频次: 15

SCOPUS被引频次:

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

近30日浏览量: 4

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