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作者:

Jin, Dong-Yue (Jin, Dong-Yue.) | Zhang, Wan-Rong (Zhang, Wan-Rong.) | Xie, Hong-Yun (Xie, Hong-Yun.) | Shen, Pei (Shen, Pei.) | Wang, Yang (Wang, Yang.)

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摘要:

In order to improve the thermal stability of RF power HBT and eliminate the self-heating effect which degenerates the transistor's electrical characteristics, the physical significance of thermal stability factor S is presented in detail based on the thermal-electric feedback network analysis. Furthermore, the expression of the minimum ballasting resistance RC of HBT to compensate the self-heating effect (S=0) is presented by taking into account of the temperature dependence of emitter current, the valence-band discontinuity at emitter junction (ΔEv), the bandgap narrowing due to heavy doping (ΔEg), additional ballasting resistance in emitter and base. It is found that the higher the temperature T is, the smaller the minimum ballasting resistance RC to compensate the self-heating effect is under the condition that (ΔEv+ΔEg)>2KT. Owing to the reducing of ballasting resistance, RF power HBT will provide higher output power, power gain, and power-added efficiency (PAE) in an amplifier block.

关键词:

Valence bands Energy gap Feedback Heterojunction bipolar transistors Thermodynamic stability Electric network analysis Heating

作者机构:

  • [ 1 ] [Jin, Dong-Yue]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Zhang, Wan-Rong]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Xie, Hong-Yun]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Shen, Pei]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 5 ] [Wang, Yang]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China

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来源 :

Journal of Beijing University of Technology

ISSN: 0254-0037

年份: 2008

期: 2

卷: 34

页码: 141-144,149

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