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[期刊论文]

A lattice model for fracturing process analysis of soldered joints in electronic package

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作者:

An, Tong (An, Tong.) | Qin, Fei (Qin, Fei.) (学者:秦飞)

收录:

EI Scopus

摘要:

Fracture of the soldered joints is the most common failure mechanism in microsystem packages due to mechanical loads. In order to satisfy the demand for understanding the process of soldered joints fracture, there is a need for a validated model, which is simple, reliable, and able to clarify of physics-of-failure of soldered joints for design improvement. The lattice model had been established to simulate the process of soldered joints fracturing. The cracking pattern from the simulation was compared with that observed in experiments. The results show that the proposed lattice model can easily be used to predict the cracking of soldered joints under tensile loading. The predicted crack pattern agrees well with that observed in experiments.

关键词:

Fracture Electronics packaging Electronic equipment Failure (mechanical) Microsystems Soldered joints Finite element method Cracks Mathematical models

作者机构:

  • [ 1 ] [An, Tong]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Qin, Fei]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China

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来源 :

Journal of Shanghai Jiaotong University (Science)

ISSN: 1007-1172

年份: 2008

期: SUPPL.

卷: 13

页码: 23-26

被引次数:

WoS核心集被引频次: 0

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