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摘要:
The microstructure of the room temperature ferromagnetic semiconductor Zn1-xCox-O1-δ was investigated by analytical electron microscopy. The experimental results indicated that the oxygen content decided the microstructure and the magnetic property of Zn1-xCoxO1-δ. The films deposited under poor oxygen consist of 5 nm sized wurtzite Zn1-xCoxO1-δ and amorphous Zn-Co-O between them, of which both are ferromagnetic phases. The films deposited under rich oxygen consist of 10-20 nm Zn1-xCoxO1-δ and antiferromagnetic phase CoO, the concentration of the oxygen vacancy in wurtzite is greatly reduced, and the room temperature ferromagnetism is greatly weakened and even disappeared.
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来源 :
Acta Metallurgica Sinica
ISSN: 0412-1961
年份: 2008
期: 11
卷: 44
页码: 1399-1403
2 . 3 0 0
JCR@2022
ESI学科: MATERIALS SCIENCE;
JCR分区:2