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作者:

Xing, P.F. (Xing, P.F..) | Chen, Y.X. (Chen, Y.X..) | Yan, Shi-Shen (Yan, Shi-Shen.) | Liu, G.L. (Liu, G.L..) | Mei, L.M. (Mei, L.M..) | Wang, K. (Wang, K..) | Han, X.D. (Han, X.D..) (学者:韩晓东) | Zhang, Z. (Zhang, Z..)

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摘要:

High temperature ferromagnetism and perpendicular magnetic anisotropy were observed in Fe-doped In2 O3 magnetic semiconductor films deposited on R -cut sapphire by pulse laser deposition. The films show a Curie temperature as high as 927 K. Strong perpendicular magnetic anisotropy with a remnant magnetization ratio of 0.77 and a coercivity of 680 Oe is demonstrated. Extensive microstructure, composition, and magnetic studies indicate that Fe element incorporates into the indium oxide lattice by substituting the position of indium atoms, which suggests the observed ferromagnetism is intrinsic rather than from Fe clusters or any other magnetic impurity phases. © 2008 American Institute of Physics.

关键词:

Magnetic semiconductors Indium Metallic films Ferromagnetism High temperature effects Magnetic anisotropy Microstructure Iron

作者机构:

  • [ 1 ] [Xing, P.F.]School of Physics and Microelectronics, National Key Laboratory of Crystal Materials, Shandong University, Jinan, Shandong 250100, China
  • [ 2 ] [Chen, Y.X.]School of Physics and Microelectronics, National Key Laboratory of Crystal Materials, Shandong University, Jinan, Shandong 250100, China
  • [ 3 ] [Yan, Shi-Shen]School of Physics and Microelectronics, National Key Laboratory of Crystal Materials, Shandong University, Jinan, Shandong 250100, China
  • [ 4 ] [Liu, G.L.]School of Physics and Microelectronics, National Key Laboratory of Crystal Materials, Shandong University, Jinan, Shandong 250100, China
  • [ 5 ] [Mei, L.M.]School of Physics and Microelectronics, National Key Laboratory of Crystal Materials, Shandong University, Jinan, Shandong 250100, China
  • [ 6 ] [Wang, K.]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, 100 Pingle Yuan, Chao Yang District, Beijing 100022, China
  • [ 7 ] [Han, X.D.]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, 100 Pingle Yuan, Chao Yang District, Beijing 100022, China
  • [ 8 ] [Zhang, Z.]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, 100 Pingle Yuan, Chao Yang District, Beijing 100022, China

通讯作者信息:

  • [xing, p.f.]school of physics and microelectronics, national key laboratory of crystal materials, shandong university, jinan, shandong 250100, china

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来源 :

Applied Physics Letters

ISSN: 0003-6951

年份: 2008

期: 2

卷: 92

4 . 0 0 0

JCR@2022

ESI学科: PHYSICS;

JCR分区:1

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次: 55

ESI高被引论文在榜: 0 展开所有

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