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摘要:
InGaN/GaN MQWs structures were grown by MOCVD. The effects of the growth interruption time on the optical and structural properties of InGaN/GaN MQWs were investigated. The growth interruption can improve the interface quality, increase the intensity of photoluminescence (PL) and electroluminescence (EL); but if the interruption time was too long, the well thickness and the average in composition of MQWs decreased, and the EL intensity also decreased due to poor interface quality and impurity derived by growth interruption.
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来源 :
Journal of Optoelectronics Laser
ISSN: 1005-0086
年份: 2007
期: 4
卷: 18
页码: 422-424
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